Perkin Elmer Spectrum One.
Fourier Transformed infrared spectroscopy (FTIR) is a technique for identification of organic materials. The technique is fast and easy to use if you have an unknown substance and want to compare it with a reference. A database also enables the identification of unknown substances.
- Identification of polymers
- Identification of foreign particles, fibers etc.
X-Ray Fluorescence Spectrometry (XRF)
Niton XL3t GOLDD, hand held.
XRF is a fast and easy to use technique for chemical analysis. The instrument is portable which enables analysis of large and heavy samples at your site. A built in database enables quick metal alloy identification.
- Metal alloy identification
- On site analysis if samples cannot be brought to the lab
- Trace elements analysis in e.g. plastics
Energy Dispersive X-ray Spectroscopy (EDX)
Oxford instruments X-act.
Energy dispersive X-ray analysis (EDX) is a microanalysis technique used in conjunction with scanning electron microscopy (SEM). EDX offers elemental identification and quantitative compositional information of features down to ~1 µm in size. EDX can be performed as point or area analysis, line scans and mappings.
- Analysis of thicker deposits, coatings and oxides
- Corrosion evaluation
- Identification of metallic materials
Electron Diffraction (EBSD)
Oxford Instruments HKL, NordlysF.
Electron back scatter diffraction is a SEM based technique that provide crystallographic information of the microstructure in crystalline materials. EBSD can give information about crystal orientation, phases, texture, internal stresses etc.
- Grain structure, size, orientation and distribution
- Phase identification
Auger Electron Spectroscopy (AES)
Physical electronics (PHI) 700Xi Scanning Auger Nanoprobe.
Auger electron spectroscopy is an analytical technique for elemental analysis of very thin films or small features. The information depth and lateral resolution for AES is in the order of nanometers. In combination with a sputtering ion gun, AES can also offer depth profiling. AES can be performed as point or area analysis, line scans and mappings.
- Surface cleanliness of implants
- Analysis of thin stains
- Analysis of small features (<1 µm)
- Depth characterizations of oxide films
Secondary Ion Mass Spectrometry (ToF-SIMS)
Physical electronics (PHI) Trift II.
Time of flight Secondary ion mass spectrometry is a technique that provides elemental, chemical state, and molecular information from surfaces of solid materials. The detection limit in ToF-SIMS is in the ppm range which makes the technique very surface sensitive. In combination with a sputtering ion gun, ToF-SIMS can also offer depth profiling. ToF-SIMS can be performed as point or area analysis, line scans and mappings
- Analysis of different deposits
- Chemical state determinations
- Analysis of trace elements
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