Optical Microscopy (LOM), (SLOM)
Light microscopy is a fast and easy to use technique for imaging.
The stereo microscope is a good starting point for examinations as it gives a good overview of the specimen. The light microscope operates at higher magnification compared to the stereo microscope and are mostly used on polished specimens.
- Plating and coating thickness
- Crack characteristics
Leica DRME Light Microscope and Olympus SZX16 Stereo Microscope.
Scanning Electron Microscopy (SEM)
Scanning electron microscopy (SEM) is a powerful technique for imaging features down to the nanometer range. SEM can provide topographical and compositional information and has a greater depth of field compared to conventional light microscopes.
- Imaging of small features
- Spatial variations in chemical composition
- Enables chemical analysis (EDX)
- Fractography in conjuntion with failure investigations
Zeiss FEG Ultra 55 with SE, BSE, In-Lens SE and In-Lens BSE detectors.
Electron Diffraction (EBSD)
Electron back scatter diffraction is a SEM based technique that provide crystallographic information of the microstructure in crystalline materials. EBSD can give information about crystal orientation, phases, texture, internal stresses etc.
- Grain structure, size, orientation and distribution
- Phase identification
Oxford Instruments HKL, NordlysF.
3D Optical Profiler
Optical profilometry is a non-contact metrology technique for surface topography characterization. The technique provides 2D and 3D images of a surface as well as numerous surface texture parameters.
Typical measurements include:
- Surface roughness
- Step hight/depth
- 3D imaging
Veeco Wyko NT9100 system and 4.1 Vision analysis software.
Click on one of the boxes to read more!