Scanning Electron Microscopy

Scanning electron microscopy (SEM) is a powerful technique for imaging features down to the nanometer range. SEM can provide topographical and compositional information and has a greater depth of field compared to conventional light optical microscopes.

Typical applications:

  • Imaging of small features
  • Spatial variations in chemical composition
  • Enables chemical analysis (EDX)
  • Fractography, an important part in failure investigations

Zeiss FEG Ultra 55 with SE, BSE, In-Lens SE and In-Lens BSE detectors.

Electron Diffraction (EBSD)

Electron backscatter diffraction is a SEM based technique that provides crystallographic information of the microstructure in crystalline materials. EBSD can give information about crystal orientation, phases, texture, internal stresses, etc.

Typical applications:

  • Grain structure, size, orientation and distribution
  • Texture
  • Phase identification

Oxford Instruments HKL, NordlysF.

Electron Microscopy
Cross Section through chrome plated grey iron
Electron Microscopy
Intercrystalline fracture in 42CrMo4
Electron Microscopy
EBSD map showing the crystal orientation in a duplex steel