Microscopy and surface analysis
Chemical analysis
- Energy Dispersive X-Ray Spectrometry (EDX), Oxford PentaFETx3
- Electron Backscatter Diffraction (EBSD), Oxford Instruments HKL, NordlysF
- Auger Electron Spectroscopy (AES), PHI 660
- Secondary Ion Mass Spectrometry (ToF-SIMS), PHI TRIFT II
